Mainly metal
The KSP series gages are stable-performance semiconductor strain gages usable for general stress measurement and transducers.
Ultra-small Strain Measurement and Highly-Sensitive Element of Transducers
Semiconductor strain gages
KSP
Self-temperature-compensation semiconductor strain gages
KSN
Ultra-linear semiconductor strain gages
KSPL
Impact Strain Measurement
High-output semiconductor strain gages
KSPH
Measurement at High-temperatures
Encapsulated strain gages
KHCX
Encapsulated strain gages
KHCV
Encapsulated strain gages
KHCR
Encapsulated strain gages
KHCS
Encapsulated strain gages
KHCM
Encapsulated strain gages
KHC
High-femperatrue,foil strain gages
KFU
High-temperature, foil strain gages
KH
High-temperature, foil strain gages
KFH
Measurement at Low-temperature
Low-temperature foil strain gages
KFL
Measurement under High Electric Field
Shielded foil strain gages
KFS
Measurement under High Magnetic Field
High-Temperature Foil Strain Gages (250??C)
KFH
Non-inductive foil strain gages
KFN
Concentrated Stress Measurement
KFR??for concentrated Stress Measurement
KFR-D9,19